Special (sensor) characterization setups

Contact: Sten Vollebregt

Dedicated permanent setups for measuring (packaged) chips under environmental conditions that cannot be provided by the wafer probe stations. We have setups for controlling temperature, pressure and UV.

Items under this topic

Nextron differential probe station

Lab infrastructure, Jun 2026

Nextron micro probe station 2

Lab infrastructure, Nov 2023

Gas sensor test setup

Lab infrastructure, Oct 2022

FEI XL30 SFEG SEM

XL30 scanning electron microscope with various detectors

Lab infrastructure, Dec 2021

Nextron micro probe station 1

Lab infrastructure, May 2020

Reconfigurable measurement setup

Lab infrastructure, May 2020